Abstract
A Co-Ni-Ga-Cr thin film materials library with a Cr concentration gradient ranging from 1.5 at.% to 5 at.% was magnetron-sputtered to determine the influence of Cr additions on the martensite transformation temperature of non-stoichiometric Co2NiGa-based Heusler alloys. An increase of the phase transformation temperature from 30 °C for 5 at.% Cr up to 100 °C for 1.5 at.% Cr was determined by a peak fitting analysis of temperature-dependent X-ray diffraction data.
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